Multiple Mode Package

Users who want to measure more than topography will appreciate the Multiple Mode Package, which adds Phase Contrast, Force Modulation, and Scanning Spreading Resistance modes to its standard static and Dynamic Force capabilities. The easyScan 2 STM, also part of this package, provides the possibility of further analysis of conductive samples.

The Phase Contrast mode images the phase shift of the resonance frequency, which is influenced by changes in the mechanical properties of the sample surface, allowing simultaneous imaging of material contrast and sample topography. Magnetic Force Microscopy is an extension of the Phase Contrast mode, using a magnetically coated tip to detect local changes in sample magnetisation, and the Scanning Spreading Resistance mode uses an electrically conducting tip to map local resistivity. All these modes allow the detection of features not visible in pure topography measurements: data storage bits, “sticky” areas, and leakage current, to name a few examples.

To facilitate positioning, the Multiple Mode Package includes the Video Module, which shows the views through the two lenses directly on the computer screen. The video image, which can be switched between the two views, can be saved for further reference.

Key features

• Mode Extension Module: Additional measuring modes and sample information
• Dual lens video camera: Inspect the cantilever position on your computer screen
• STM Scan Head: AFM complement for research and education

Application examples   1) + 2) 3) + 4) 1) + 2)  Thin layer of a blend of PS/PMMA film. Topography / phase contrast 3) + 4)   Magnetic hard disk. Topography / magnetic bits