Nanosurf LensAFM Webinar (May 9, 2012)

"Advancements in Instrumentation for Surface Inspection and Defect Analysis"


This webinar highlights:

  • Ease of adaptation with multiple optical platforms
  • Synergy and convenience of combining optical and 3D topographical information in the same place
  • Examples of industrial applications that have benefited from the combined platform.


Application areas:

  • Topography information: roughness measurements, defect analysis, edge radius, step heights
  • Material property information: hardness, wear analysis, conductance/resistance, magnetism


 
The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.


 
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