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FluidFM
A multifunctional tool for single-cell biology, tissue engineering, nanopatterning and nanolithography

ARTIDIS
A new tool for automated nanomechanical tissue diagnostics and soft material analysis

FlexAFM
Your versatile research AFM for materials and life science

NaniteAFM
Mountable AFM for industry

LensAFM
AFM for optical microscopes and 3D profilometers

AFM for SEM
Have you ever wanted to get fast 3D information in SEM?

NaioAFM
An affordable all-in-one AFM for nano education and small samples

NaioSTM
An easy entry into the world of atoms

AFM Accessories
Everything to complement your Nanosurf SPM system

Custom Solutions
Systems tailored to your needs

Nanosurf Video
Your entry into the exciting world of nanoscale science and surface technology

Contact
Nanosurf offers worldwide distribution and support!

Nanosurf LensAFM Webinar (May 9, 2012)

"Advancements in Instrumentation for Surface Inspection and Defect Analysis"


This webinar highlights:

  • Ease of adaptation with multiple optical platforms
  • Synergy and convenience of combining optical and 3D topographical information in the same place
  • Examples of industrial applications that have benefited from the combined platform.


Application areas:

  • Topography information: roughness measurements, defect analysis, edge radius, step heights
  • Material property information: hardness, wear analysis, conductance/resistance, magnetism


 
The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.