Nanosurf & Kleindiek AFM for SEM
Have you ever wanted to get fast 3D information in SEM?
Nanosurf and Kleindiek have the plug-and-play retrofit solution for you. The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens exciting new possibilities. SEM’s are widely used for analytics in the micrometer and nanometer range and AFM techniques are useful for investigating the surfaces and characteristics of different materials down to nanometer detail.
Main features and benefits of the AFM for SEM:
- 3D information from simultaneous SEM and AFM pictures
- Notably compact (height 10 mm)
- Simple to operate
- Load-lock compatible
- Extremely stable operation
- Easy sample and tip exchange without laser adjustment
- Can be used in combination with micromanipulators and other in-situ and ex-vivo tools
- Works in air and in SEM
For more details, download the AFM for SEM brochure.
For a quote or further information, please contact us directly.
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