An all-in-one AFM for nano education and small samples
An easy entry into the world of atoms
Your versatile research AFM for materials and life science
A unique new tool for single cell biology and beyond
A powerful add-on to optical microscopes and 3D profilometers
7. Easyscan 2 AFM
A straightforward and modular AFM for surface analysis at the nanoscale
8. News & Events
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A new tool for nanomechanical tissue diagnostics
Mountable AFM for industry
Everything to complement your Nanosurf SPM system
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13. Watch video
Overview of general handling and working with the Nanosurf LensAFM
14. Watch videos
Overview of key features and general handling of the Nanosurf NaioAFM
Nanosurf offers worldwide distribution and support!
Nanosurf & Kleindiek AFM for SEM
Have you ever wanted to get fast 3D information in SEM?
Nanosurf and Kleindiek have the plug-and-play retrofit solution for you. The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens exciting new possibilities. SEM’s are widely used for analytics in the micrometer and nanometer range and AFM techniques are useful for investigating the surfaces and characteristics of different materials down to nanometer detail.
Main features and benefits of the AFM for SEM:
- 3D information from simultaneous SEM and AFM pictures
- Notably compact (height 10 mm)
- Simple to operate
- Load-lock compatible
- Extremely stable operation
- Easy sample and tip exchange without laser adjustment
- Can be used in combination with micromanipulators and other in-situ and ex-vivo tools
- Works in air and in SEM
For more details, download the AFM for SEM brochure.
For a quote or further information, please contact us directly.