Silicon wafer

A semiconductor sample

Steps on (111) oriented silicon wafer.

Imaged with a Nanosurf easyScan DFM by Martin Eckstein. Advanced Lab Course 20, Augsburg University, EKM, Experimentalphysik 6.

10x10µm image, z-range: 38.8nm

The image shows steps on
(111) oriented silicon wafer.
The measurement was
done in "Dynamic Force" operating mode.

Other Nanosurf applications