Analyzing large surfaces using AFM stitching

This application note describes the automated stitching feature of the Nanosurf Nanite AFM scripting interface in combination with the Nanosurf Report Expert analysis software

AFM measurements on an LCD panel are used as an example to demonstrate how stitching can thus be used to easily and efficiently generate high-resolution topography maps of large surface areas.

Scan range 700µm x 700µm; Z range 2µm
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