满足用户需求,提供专业订制方案

Flex-ANA — AFM for force mapping

完全根据您的指标规格要求订制的系统或部件

我们不仅仅提供用于研发与工业领域的标准产品,基于以客户为导向、全范围的AFM方案提供者,我们还针对AFM系统、样品台与部件提供设计开发客户定制化服务

我们有专业的工程师研发团队,随时准备好讨论您的具体应用,然后为您设计与生产最理想化的解决方案。联系我们告诉我们您的基本需求 我们会很高兴地联系您进行深层次地讨论您的项目。

为大概了解以下我们能做的样品台或技术方案, 请下载我们的 客户订制方案广告册 或浏览下我们已有的一些样品台或方案实例:

重载荷XYZ三轴自动移动台
八英寸XYZ三轴自动移动台
XZΘ三轴自动移动台
XYZΘΦ四轴移动与变角自动移动台
Z向高度可变的XY自动移动台
XY自动移动台
XY手动移动台
大理石台Z向手动台
多功能探针底座
AFSEM™
电镜中的AFM

重载荷XYZ三轴自动移动台

With large samples in mind, this high-load, high-precision, and low-noise translation stage pushes the boundaries of sample stage performance. A pneumatic lift/lock mechanism ensures easy travel when lifted and stable measurements when locked. Large travel ranges and heavy-duty integrated active vibration isolation complement the setup. The system was designed for use with the NaniteAFM.

描述 技术参数
最大XYZ移动行程: 275 mm; 150 mm; 50 mm
XYZ马达移动步进: 0.5 µm
XYZ马达分辨率: σ = 1 µm
重复定位精度: ± 5 µm
绝对精度: ± 10 µm
最大速度: n.a.
样品平台尺寸 : 290 × 550 mm
样品尺寸: max. 250 × 700 × 175 mm
样品重量: max. 150 kg
样品台尺寸: 530 × 590 × 470 mm
样品台重量: 130 kg
样品台技术: Spindle-stepper motors, air bed
噪音水平: < 0.6 Å (NaniteAFM 10-µm scan head in quiet environment)

八英寸XYZ三轴自动移动台

Motorized 8 inch translation stage

This motorized XYZ translation stage was constructed for serial measurements on wafers up to 8" in diameter and on general AFM samples up to 60 mm in height. It features precise movements in all directions and magnets to keep metalic samples in place. The stage was designed for use with the NaniteAFM atomic force microscope.

描述 技术参数
XYZ最大移动行程: 205 mm; 245 mm; 70 mm
XYZ马达移动步进: 50–1000 nm
XYZ马达分辨率: 0.3 µm
重复定位精度: σ = 1 µm
绝对精度: ± 20 µm
最大速度: 13 mm/s
样品平台尺寸: 205 × 205 mm
样品尺寸: max. Ø8" × 60 mm
样品台尺寸: 510 × 500 × 260 mm
样品台重量: 65 kg
样品台技术: Piezo stick-slip motors

Motorized XZΘ translation stage

Motorized XZΘ translation stage

This custom-built translation stage was constructed to allow roughness measurements on large concave and convex samples. It features full 360° manual rotation of the sample platform and automated rotation of the scan head to accommodate the curved form of the various samples. The stage was designed for use with the NaniteAFM atomic force microscope.

描述 技术参数
XZ最大移动行程 / Θ: 250 mm; 60 mm / 100 deg
XZ马达步进 / Θ: 50–1000 nm / 0.16–1.6 mdeg
XZ马达分辨率 / Θ: 0.3 µm / 1 mdeg
重复定位精度: σ = 1 µm / σ = 3 mdeg (σ = 8 µm for all axes combined)
绝对精度: ± 10 µm / ± 25 mdeg
最大速度: 13 mm/s
样品平台尺寸: Ø400 mm
样品台旋转: 360° 手动
样品尺寸: max. Ø380 mm x 220 mm
样品台机构尺寸: 450 × 550 × 460 mm
样品台重量: 75 kg
样品台技术 Piezo stick-slip motors
噪音水平: < 0.5 Å (NaniteAFM 10-µm scan head in quiet environment)

Motorized XYZΘΦ translation and goniometer stage

Motorized XYZΘΦ translation and goniometer stage

This custom stage was tailored for very precise sample alignment and humidity control to allow levelling of the sample plane with respect to the FlexAFM atomic force microscope. The FlexAFM scan head itself was modified to match the custom stage dimensions. A custom holder was developed to allow it to be used for soft lithography.

Description 描述 Specification 技术参数
Max. traverse path XYZ 最大XYZ移动行程 / ΘΦ: 72 mm; 46 mm; 5 mm / ± 5°
Step size XYZ 马达步进/ ΘΦ: 50–1000 nm / 0.16–1.6 mdeg
Resolution XYZ马达分辨率 / ΘΦ: 0.3 µm / 0.3 mdeg
Repositioning accuracy 重复定位精度: σ = 1 µm / σ = 1 mdeg
Absolute accuracy 绝对精度: ± 10 µm / ± 20 mdeg
Max. velocity 最大速度: 13 mm/s / 4 deg/s
Sample platform size 样品平台尺寸: 75 × 50 mmm
Sample size 样品尺寸: max. 75 × 50 × 13 mm
Sample weight 样品重量: max. 150 g
Stage size 样品台尺寸: 204 × 204 × 132 mm
(without environmental control chamber)
Stage weight 样品台重量: Approx. 5 kg (without environmental control chamber)
Stage technology 样品台技术: Piezo stick-slip motors

Motorized XY translation stage with variable Z-range

Motorized XY translation stage with variable Z-range

This custom motorized translation stage for the NaniteAFM atomic force microscope was tailored for reproducible placement of samples with a variable thickness.

Description 描述 Specification 技术参数
Manual Z-travel 手动Z向移动台: 30 mm
Max. traverse path XY 最大XY移动行程: 32 mm in both directions
Step size XY 马达步进: 50–1000 nm
XY马达分辨率: 0.3 µm
重复定位精度: σ = 1 µm
绝对精度 : ± 10 µm
最大速度: 13 mm/s
样品平台尺寸: 63 × 63 mm
样品尺寸 : max. 63 × 63 × 50 mm
样品台机构尺寸: 204 × 204 × 200 mm
样品台重量: 约3.5 kg
样品台技术 : Piezo stick-slip motors

Motorized XY translation stage

Motorized XY translation stage

This custom motorized translation stage for the NaniteAFM atomic force microscope was tailored for simple joystick handling and custom travel ranges.

描述 技术参数
手动Z向移动台: 30 mm
最大XY移动行程: 200 mm; 60 mm
XY马达步进: 50–1000 nm
XY马达分辨率: 0.3 µm
重复定位精度: σ = 1 µm
绝对精度: ± 10 µm
最大速度: 13 mm/s
样品平台尺寸: 200 × 100 mm
样品尺寸: max. 250 × 120 × 50 mm
样品重量: max. 2 kg
样品台技术: Piezo stick-slip motors

XY手动移动台

Manual XY translation stage

This custom manual translation stage for the NaniteAFM atomic force microscope was tailored for extended X-, Y-, and Z-ranges.

描述 技术参数
最大XYZ移动行程 50 mm; 25 mm; 30 mm
样品平台尺寸: 63 × 63 mm
样品尺寸: max. 63 × 63 × 50 mm
样品台机构尺寸: 204 × 204 × 210 mm
样品台重量: 约4 kg
噪音水平: < 0.5 Ņ (NaniteAFM 10-µm scan head in quiet environment)

大理石台Z向手动台

Manual Z stage on stone table

This custom manual translation stage for the NaniteAFM atomic force microscope was tailored for a modularly adjustable height range and large/heavy samples. It was built as an affordable, low-noise solution.

描述 技术参数
最大XYZ移动行程 30 mm (手动)
样品尺寸: max. 500 × 80 × 80 mm
样品台机构尺寸: 400 × 500 × 300 mm
样品台重量: 57 kg
噪音水平: < 0.5 Ņ (NaniteAFM 10-µm scan head in quiet environment)

多功能探针底座

Multifunctional cantilever holder Multifunctional cantilever holder zoom

This custom FlexAFM cantilever holder with flex-print was designed for easy exchange and use of microcontacted smart cantilevers.

描述 技术参数
静态力AFM:
动态力AFM:
电接触点数目: 7 (包括地线)
定位精度: 约 50 µm
探针基座尺寸: 3.0 × 1.5 × 0.65 mm

AFSEM™ on custom stage

AFSEM application in air

This custom stage with integrated vibration isolation table and high-resolution overview camera uses the AFSEM™ atomic force microscope to eliminate sample access size restrictions that would not allow the use of any other AFM scan head. The AFSEM™ — with its narrow nose piece and self-sensing cantilevers — was the ideal fit for this application. A manual micrometer translation stage allows for precise positioning of the sample underneath the AFSEM™ scanner.

Since the AFSEM™ is normally used inside a scanning electron microscope, vacuum applications are also possible with this instrument.

Features and specifications:

Easy to operate
Extremely stable operation
AFM scan heads works in air, vacuum, and in SEM
Easy sample and tip exchange without laser alignment (because of self-sensing cantilevers)
Description Specification
Scan head type: Tip scanner
Scan head weight: 500 g
Scan head dimensions: 44 × 110 × 77 mm
AFM scan range (XYZ): 35 × 35 × 5 µm
AFM scanner resolution: 24-bit, closed-loop scanning
Motorized approach: 25 mm (at tip position)
HV compatibility: <1 × 10–6 mbar

For more details, view or download the AFSEM™ brochure.

AFM for SEM

AFM for SEM

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens exciting new possibilities. SEMs are widely used for analytics in the micrometer and nanometer range and AFM techniques are useful for investigating the surfaces and characteristics of different materials down to nanometer detail.

电镜中的AFM的主要特征与优势:

同步SEM与AFM图像并获取三维信息
设计尤其紧凑
操作简便
兼容于载物腔室
操作稳定
探针更换方便,无需调节激光
兼容于其他微操作机械手与其他在线或已有工具
兼容在大气中与电镜环境中操作

需要更多信息,请查看或下载电镜中的AFM广告册.

Nanosurf优势

Flexible
Customizable
Exactly what you need

用户反馈

定制广告册

Innovation, Ease of Use, Reliability!

 

Nanosurf ● Next‑Level Nanotechnology Tools