Integration of Magnetoresistive Sensors with Atomic Force Microscopy Cantilevers for Scanning Magnetoresistance Microscopy Applications

IEEE Transactions on Magnetics 51 (2015) 6503104

Margaret Costa, João Gaspar, Ricardo Ferreira, Elvira Paz, Helder Fonseca, Marco Martins, Susana Cardoso, Paulo P. Freitas

A novel AFM cantilever with magnetoresistive sensors integrated in its tip was developed and employed for scanning magnetoresistance microscopy (SMRM) measurements using a Nanosurf FlexAFM scan head with a customized cantilever holder. The output signal of magnetoresistive sensors was read by Nanosurf C3000 controller to map absolute value of magnetic stray field.