Advancements in instrumentation for surface inspection and defect analysis
This webinar highlights: (A) ease of adaptation with multiple optical platforms, (B) synergy and convenience of combining optical and 3D topographical information in the same place, and (C) examples of industrial applications that have benefited from the combined platform.
Application areas: (A) topography information: roughness measurements, defect analysis, edge radius, step heights, (B) material property information: hardness, wear analysis, conductance/resistance, magnetism.
The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.