Lateral force contrast on dots produced by Dip-Pen Nanolithography

The Nanosurf FlexAFM offers LFM in combination with easy handling, making it an obvious choice for DPN® analysis.

Several different lithography techniques exist that allow modification of material surfaces during or after their microfabrication. One of the most versatile of these techniques probably is the so-called Dip-Pen Nanolithography® (PDN). DPN® is the nanoscale equivalent to writing with a fountain pen, in which the tip of an atomic force microscope (AFM) cantilever acts as the pen. The characteristics of materials deposited by DPN® are usually studied by Lateral Force Microscopy (LFM), as it is one of the few techniques capable of detecting material differences at such high resolutions.

Left: Topography (Scan range 1 µm x 1 µm; Z range 0.4 nm)
			Right: Lateral Force (Scan range 1 µm x 1 µm; Z range 1.1 V)
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