Scanning thermal microscopy

This is an example of a scanning thermal measurement performed with a FlexAFM scan head equipped with a VertiSense temperature sensing cantilever from AppNano.

3D overlay of temperature over topography

Temperature shown as color overlay on the 3D topography.

Data processing: Gwyddion
Image size: 25 µm
Temperature range: 15 degrees

The sample consists of two high dose implanted Si tongues with a low dose connection in between. When applying a potential between the tongues, the temperature increase is highest in the connection.

The amplifier is connected to a user input of the Nanosurf AFM controller (Easyscan 2 or C3000) via a BNC cable.

View application note (PDF)

Possible with

Industrial solutions

In addition to our standard products we can design and develop custom-built atomic force microscope systems, stages, and parts. A dedicated team of highly qualified engineers is ready to create the optimal solution for your industrial application. For a first impression of what we can do, have a look at these examples.

Flex-Axiom — AFM for materials research

By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of materials research applications to be handled with ease. Together with the powerful C3000 controller, complex material characterizations are possible.

Flex-Bio — AFM for biology and life science

A key success factor in life science research is the combination of multiple techniques. With the Flex-Bio, Nanosurf's Bio AFM, you can combine the AFM imaging, spectroscopy and nanomanipulation capabilities of this system with the high-end optical imaging techniques available for inverted microscopes.