Atomic structure of a TiS2 surface

With the easyScan STM synthetic TiS2 single crystals have been investigated. On the 'as grown' material holes are observed on a large scan size.

Closer examination (cross section) reveals that the depth of the holes amounts to about 4 Angstroem which corresponds to a single atomic layer.

The STM experiments were performed under ambient conditions using mechanically prepared Pt-Ir tips. Typical tunneling parameters of 3.8 nA tunneling current and 180 mV GapVoltage were applied.


5x5nm image; z-range 0.2nm

STM measurements on TiS2 single crystal (raw data)

View application note (PDF)

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Industrial solutions

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Flex-Axiom — AFM for materials research

By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of materials research applications to be handled with ease. Together with the powerful C3000 controller, complex material characterizations are possible.

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A key success factor in life science research is the combination of multiple techniques. With the Flex-Bio, Nanosurf's Bio AFM, you can combine the AFM imaging, spectroscopy and nanomanipulation capabilities of this system with the high-end optical imaging techniques available for inverted microscopes.