This overview of AFM/SPM is a practical, hands-on course to teach the principles of operation, basic and advanced imaging modes, and overall capabilities of atomic force microscopy/scanning probe microscopy. In lectures interwoven with labs on a variety of samples, students will learn, understand, and operate state-of-the-art microscopes. Laboratory instruction will take place on AFMs by Nanosurf, Bruker and Asylum Research.
This AFM/SPM course provides a foundation for students in the operation of atomic force microscopes to understand (and be able to select appropriately) the various modes and how best to operate the microscope by understanding the operating principles. At the end of the course, students will be able to set up an imaging experiment and run basic static and dynamic AFM modes. They will also gain an understanding of the various imaging parameters involved and how to optimize the parameters for best imaging results. Some advanced topics such as advanced imaging modes and simulation capabilities are also covered to provide students with a comprehensive background to the field. Finally, students will learn the various image processing tools available to properly analyze and interpret their images.
The course will break out into three groups for the hands-on part of the course. The Nanosurf group will be working with a Flex-AFM.
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Hooke College of Applied Sciences
850 Pasquinelli Drive
Westmont Illinois 60559