Found at the heart of many nanotechnology applications, scanning probe microscopy (SPM) offers powerful techniques to image and control microscopic objects. As a key enabler of new SPM modes for highly demanding applications, Zurich Instruments wishes to bring together the community of users who may be facing distinct measurement challenges and yet share core competencies and know-how.
Scanning probe microscopy has the unique ability to explore electrical properties of materials at the nanometer scale. A better understanding of nanoscale electronics through nanoscale investigations of catalysis, corrosion, photovoltaic and energy storage material is critical to address the clean energy challenge. Dr. Dominik Ziegler, CTO of Nanosurf, will discuss ongoing efforts to develop turnkey solutions for the key nanoscale electrical characterization techniques, including scanning microwave impedance microscopy (SMM), Kelvin probe force microscopy (KPFM), scanning electrochemical microscopy (SECM). His talk is scheduled for 14:25.