Introducing the leading solution for correlative AFM-SEM-EDX analysis — March 15, 2017 (10:00 CET and 18:00 CET)
The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.
Topics will include:
|Introduction and overview of the AFSEM™ system|
|Compatibility to existing SEMs and additional add-ons
(e.g. tensile stages or nanoindenters)
|Recent application advances
(e.g. in-situ roughness and conductivity analysis,
correlative SEM/EDX/AFM, 3D tomography)
Experts will be online to answer your specific AFSEM™ application and instrumentation questions after the conclusion of the webinar.
Please register for the webinar at https://attendee.gotowebinar.com/register/8935183822973131011. After registering, you will receive a confirmation e-mail containing information about joining the webinar.