AFSEM™ Webinar

Introducing the leading solution for correlative AFM-SEM-EDX analysis — March 15, 2017 (10:00 CET and 18:00 CET)

AFSEM™ — Correlative AFM and SEM

The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.

Join us for an exciting Nanosurf and GETec webinar to explore the recent advances in correlative AFM-SEM-EDX analysis and learn how to combine these techniques in an interactive experiment.

Topics will include:

Introduction and overview of the AFSEM™ system
Compatibility to existing SEMs and additional add-ons
(e.g. tensile stages or nanoindenters)
Recent application advances
(e.g. in-situ roughness and conductivity analysis,
correlative SEM/EDX/AFM, 3D tomography)
Combined SEM imaging, chemical analysis by EDX, AFM topography, and conductivity analysis

Experts will be online to answer your specific AFSEM™ application and instrumentation questions after the conclusion of the webinar.

Please register for the webinar at https://attendee.gotowebinar.com/register/8935183822973131011. After registering, you will receive a confirmation e-mail containing information about joining the webinar.