Custom solutions that fit your exact needs

Systems or components that are fully tailored to your specifications and requirements

In addition to our standard products for research, industry, and nanoeducation, we now offer a unique service that fits right in with our philosophy of being a dedicated, full-range AFM solution provider: designing and developing custom-built AFM systems, stages, and parts. A dedicated team of engineers is ready to discuss your specific application, and to design and produce the optimal solution for you.

For a first impression of what we can do, please see some examples below or download our custom solutions brochure. To discuss various options in more detail, please contact us directly.

 

 Motorized XYZ translation stage

 
 

With large samples in mind, this high-load, high-precision, and low-noise translation stage pushes the boundaries of sample stage performance. A pneumatic lift/lock mechanism ensures easy travel when lifted and stable measurements when locked. Large travel ranges and heavy-duty integrated active vibration isolation complement the setup.

The system was designed for use with the NaniteAFM atomic force microscope.

 
Description Specification
Max. traverse path XYZ: 275 mm; 150 mm; 50 mm
Step size XYZ: 0.5 µm
Resolution XYZ: σ = 1 µm
Repositioning accuracy: ± 5 µm
Absolute accuracy: ± 10 µm
Max. velocity: n.a.
Sample platform size: 290 × 550 mm
Sample size: max. 250 × 700 × 175 mm
Sample weight: max. 150 kg
Stage size: 530 × 590 × 470 mm
Stage weight: 130 kg
Stage technology: Spindle-stepper motors, air bed
Noise level: < 0.6 Å (NaniteAFM 10-µm scan head in quiet environment)

 

 Motorized XZΘ translation stage

 
Motorized XZΘ translation stage
 

This custom-built translation stage was constructed to allow roughness measurements on large concave and convex samples. It features full 360° manual rotation of the sample platform and automated rotation of the scan head to accommodate the curved form of the various samples. The stage was designed for use with the NaniteAFM atomic force microscope.

 
Description Specification
Max. traverse path XZ / Θ: 250 mm; 60 mm / 100 deg
Step size XZ / Θ: 50–1000 nm / 0.16–1.6 mdeg
Resolution XZ / Θ: 0.3 µm / 1 mdeg
Repositioning accuracy: σ = 1 µm / σ = 3 mdeg (σ = 8 µm for all axes combined)
Absolute accuracy: ± 10 µm / ± 25 mdeg
Max. velocity: 13 mm/s
Sample platform size: Ø400 mm
Sample platform rotation: 360° manually
Sample size: max. Ø380 mm x 220 mm
Stage size: 450 × 550 × 460 mm
Stage weight: 75 kg
Stage technology: Piezo stick-slip motors
Noise level: < 0.5 Å (NaniteAFM 10-µm scan head in quiet environment)

 

 Motorized XYZΘΦ translation and goniometer stage

 
Motorized XYZΘΦ translation and goniometer stage
 

This custom stage was tailored for very precise sample alignment and humidity control to allow levelling of the sample plane with respect to the FlexAFM atomic force microscope. The FlexAFM scan head itself was modified to match the custom stage dimensions. A custom holder was developed to allow it to be used for soft lithography.

 
Description Specification
Max. traverse path XYZ / ΘΦ: 72 mm; 46 mm; 5 mm / ± 5°
Step size XYZ / ΘΦ: 50–1000 nm / 0.16–1.6 mdeg
Resolution XYZ / ΘΦ: 0.3 µm / 0.3 mdeg
Repositioning accuracy: σ = 1 µm / σ = 1 mdeg
Absolute accuracy: ± 10 µm / ± 20 mdeg
Max. velocity: 13 mm/s / 4 deg/s
Sample platform size: 75 × 50 mmm
Sample size: max. 75 × 50 × 13 mm
Sample weight: max. 150 g
Stage size: 204 × 204 × 132 mm
(without environmental control chamber)
Stage weight: Approx. 5 kg (without environmental control chamber)
Stage technology: Piezo stick-slip motors

 

 Motorized XY translation stage with variable Z-range

 
Motorized XY translation stage with variable Z-range
 

This custom motorized translation stage for the NaniteAFM atomic force microscope was tailored for reproducible placement of samples with a variable thickness.

 
Description Specification
Manual Z-travel: 30 mm
Max. traverse path XY: 32 mm in both directions
Step size XY: 50–1000 nm
Resolution XY: 0.3 µm
Repositioning accuracy: σ = 1 µm
Absolute accuracy: ± 10 µm
Max. velocity: 13 mm/s
Sample platform size: 63 × 63 mm
Sample size: max. 63 × 63 × 50 mm
Stage size: 204 × 204 × 200 mm
Stage weight: Approx. 3.5 kg
Stage technology: Piezo stick-slip motors

 

 Motorized XY translation stage

 
Motorized XY translation stage
 

This custom motorized translation stage for the NaniteAFM atomic force microscope was tailored for simple joystick handling and custom travel ranges.

 
Description Specification
Manual Z-travel: 30 mm
Max. traverse path XY: 200 mm; 60 mm
Step size XY: 50–1000 nm
Resolution XY: 0.3 µm
Repositioning accuracy: σ = 1 µm
Absolute accuracy: ± 10 µm
Max. velocity: 13 mm/s
Sample platform size: 200 × 100 mm
Sample size: max. 250 × 120 × 50 mm
Sample weight: max. 2 kg
Stage technology: Piezo stick-slip motors

 

 Manual XY translation stage

 
Manual XY translation stage
 

This custom manual translation stage for the NaniteAFM atomic force microscope was tailored for extended X-, Y-, and Z-ranges.

 
Description Specification
Max. traverse path XYZ 50 mm; 25 mm; 30 mm
Sample platform size: 63 × 63 mm
Sample size: max. 63 × 63 × 50 mm
Stage size: 204 × 204 × 210 mm
Stage weight: Approx. 4 kg
Noise level: < 0.5 Ņ (NaniteAFM 10-µm scan head in quiet environment)

 

 

 Manual Z stage on stone table

 
Manual Z stage on stone table
 

This custom manual translation stage for the NaniteAFM atomic force microscope was tailored for a modularly adjustable height range and large/heavy samples. It was built as an affordable, low-noise solution.

 
Description Specification
Max. traverse path XYZ 30 mm (manual)
Sample size: max. 500 × 80 × 80 mm
Stage size: 400 × 500 × 300 mm
Stage weight: 57 kg
Noise level: < 0.5 Ņ (NaniteAFM 10-µm scan head in quiet environment)

 

 

 Multifunctional cantilever holder

 
Multifunctional cantilever holder Multifunctional cantilever holder zoom
 

This custom FlexAFM cantilever holder with flex-print was designed for easy exchange and use of microcontacted smart cantilevers.

 
Description Specification
Static mode AFM: Enabled
Dynamic mode AFM: Enabled
Number of electrical contacts: 7 (including ground)
Positioning accuracy: approx. 50 µm
Cantilever substrate size: 3.0 × 1.5 × 0.65 mm

 

 

 AFM for SEM

 
AFM for SEM
 

The combination of Atomic Force Microscopy (AFM) and Scanning Electron Microscopes (SEM) opens exciting new possibilities. SEMs are widely used for analytics in the micrometer and nanometer range and AFM techniques are useful for investigating the surfaces and characteristics of different materials down to nanometer detail.

 

Main features and benefits of the AFM for SEM:

3D information from simultaneous SEM and AFM pictures
Notably compact (height 10 mm)
Simple to operate
Load-lock compatible
Extremely stable operation
Easy sample and tip exchange without laser adjustment
Can be used in combination with micromanipulators and other in-situ and ex-vivo tools
Works in air and in SEM
 

For more details, view or download the AFM for SEM brochure.

 

Innovation, Ease of Use, Reliability!

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