The most flexible AFM for materials research
The most flexible atomic force microscope for materials research
Most flexible scan head available
Suitable for any sample size
Modular concept: configure your FlexAFM to exactly match your needs
For success in materials research studies, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible AFMs ever, allowing a large variety of materials research applications to be handled with ease. In combination with the powerful C3000 controller, complex material characterizations are possible.
Used by hundreds of researchers for many applications
The Flex-Axiom is your reliable tool for topographical and metrological imaging of samples in both air and liquid. But the Flex-Axiom goes beyond topography, for example with advanced mechanical, electrical, or magnetic characterization. The system has also been successfully used for local sample manipulation.
The precision and performance you need for your research
The Flex-Axiom uses an extremely linear electromagnetic scanner for XY movement. This scanner delivers an average linearity deviation of less than 0.1% over the full scan range, top-ranking on the AFM market. The Z-axis is piezo-driven, with a position sensor that enables closed-loop operation. A sensitive cantilever detection system can measure well into the MHz frequency range. The scan head is connected to the full-featured, 24-bit C3000 controller with digital feedback and 2 dual-channel lock-in amplifiers.