NaniteAFM — AFM for large samples

Flex-ANA — AFM for force mapping

Compact and mountable atomic force microscope for large-sample measurements

 

 Key features and benefits

 
Compact and robust atomic force microscope for stand alone and large stage operation
Easy and quick cantilever exchange and alignment reduces downtime
Automated batch measurements and scripting interface for system integration

 

 

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 Applications

 
Integration into other analysis systems
Automated or serial measurements
Large areas (also stitching)
Product development / quality control
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 Accessories

 
Customized stages

 

 Software

 
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Nanosurf ● Next‑Level Nanotechnology Tools