NaniteAFM — AFM for large samples

Flex-ANA — AFM for force mapping

Compact and mountable atomic force microscope for large-sample measurements

The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures. Simple handling and a multitude of integration possibilities bring your product analyses to a whole new level. Check coatings for intended structures or irregularities alike, or use additional AFM measurement modes to detect features not visible in topography alone. Its ease of use and reproducibility make the NaniteAFM the perfect quality control tool for precision engineering, production process optimization, or semiconductor fabrication — just to name a few.


 Key features and benefits

Compact and robust atomic force microscope for stand alone and large stage operation
Easy and quick cantilever exchange and alignment reduces downtime
Automated batch measurements and scripting interface for system integration




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Integration into other analysis systems
Automated or serial measurements
Large areas (also stitching)
Product development / quality control
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