NaniteAFM — AFM for large samples

Flex-ANA — AFM for force mapping

Compact and mountable atomic force microscope for large-sample measurements


 Key features and benefits

Compact and robust atomic force microscope for stand alone and large stage operation
Easy and quick cantilever exchange and alignment reduces downtime
Automated batch measurements and scripting interface for system integration




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Integration into other analysis systems
Automated or serial measurements
Large areas (also stitching)
Product development / quality control
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Customized stages



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