The effects of the growth pressure and annealing conditions on perpendicular magnetic anisotropy of sputtered NdFeCo films on Si(111)

Journal of Alloys and Compounds 605 (2014) 149

Liuniu Tong, Tingting Li, Xianmei He, Peng Deng

Nanosurf AFM was employed for Magnetic Force Microscopy (MFM) study of NdFeCo thin films with strong perpendicular magnetic anisotropy deposited onto Si. The observed stripe-like magnetic domains exhibit a variety of configurations ranging from ordered parallel stripe to disordered labyrinthine patterns that depend on residual stress, presence of defects and magnetic history.

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