Nanosurf — Swiss Manufacturer of Atomic Force Microscopes
  • Home
  • Products
    • RESEARCH AFMRESEARCH AFM
    • DriveAFM
    • FlexAFM
    • CoreAFM
    • LensAFM
    • NaioAFM
    • NaioSTM
    • INDUSTRIAL AFMINDUSTRIAL AFM
    • Alphacen 300
    • Customizing
  • Applications
  • Support
    • AFM THEORYAFM THEORY
    • History and Background of AFM
    • AFM Working Principle
    • AFM Modes
      • Contact Modes
      • Dynamic Modes
      • Topography and surface roughness measurements
      • Advanced Modes
      • Magnetic Force Microscopy (MFM)
      • Electrical AFM Modes
      • Conductive AFM (C-AFM)
      • Piezoelectric force microscopy (PFM)
      • Electrostatic force microscopy (EFM)
      • Kelvin probe force microscopy (KPFM)
      • Force Spectroscopy
      • Nanolithography and Nanomanipulation
      • Electrochemical AFM
    • How much does an AFM cost?
    • PUBLICATIONSPUBLICATIONS
    • Google Scholar
    • Featured Publications
    • Other Publications
    • VIDEOSVIDEOS
    • Handling Videos
    • Webinars
    • Interviews
    • SOFTWARESOFTWARE
    • CONTACT SUPPORTCONTACT SUPPORT
  • Company
    • ABOUT USABOUT US
    • News
    • Events
    • Partners
    • PEOPLEPEOPLE
    • AFM Experts
    • Management
    • Board
    • Jobs
    • CONTACTCONTACT
    • Distribution
    • Contact Us
    • Search
    • R&DR&D
    • ARAC
  • Shop

MENU

  • Home
  • Products
    • RESEARCH AFMRESEARCH AFM
    • DriveAFM
    • FlexAFM
    • CoreAFM
    • LensAFM
    • NaioAFM
    • NaioSTM
    • INDUSTRIAL AFMINDUSTRIAL AFM
    • Alphacen 300
    • Customizing
  • Applications
  • Support
    • AFM THEORYAFM THEORY
    • History and Background of AFM
    • AFM Working Principle
    • AFM Modes
    • How much does an AFM cost?
    • PUBLICATIONSPUBLICATIONS
    • Google Scholar
    • Featured Publications
    • Other Publications
    • VIDEOSVIDEOS
    • Handling Videos
    • Webinars
    • Interviews
    • SOFTWARESOFTWARE
    • CONTACT SUPPORTCONTACT SUPPORT
  • Company
    • ABOUT USABOUT US
    • News
    • Events
    • Partners
    • PEOPLEPEOPLE
    • AFM Experts
    • Management
    • Board
    • Jobs
    • CONTACTCONTACT
    • Distribution
    • Contact Us
    • Search
    • R&DR&D
    • ARAC
  • Shop
Contact us
  1. Home
  2. Publication
  3. Large-Area Scanning Probe Nanolithography Facilitated by Automated Alignment of Probe Arrays

Large-Area Scanning Probe Nanolithography Facilitated by Automated Alignment of Probe Arrays

RSC advances

RSC Advances 5 (2015) 61402

Shuai Wang, Joseph Hosford, William P Heath, Lu Shin Wong

Keywords: Customized automated translation and goniometer stage, FlexAFM, C3000, Lithography

About Nanosurf
Distribution Network
Events

How AFM Works
Software Downloads
Videos

AFM & STM Products
AFM Applications
Nanosurf News

Contact Us
Sitemap
Shop

Sign up for our Newsletter
Edit email preferences
Unsubscribe from emails

Nanosurf AG ● Gräubernstrasse 12, 4410 Liestal, Switzerland ● Phone: +41 61 927 47 47 ● Fax: +41 61 927 47 00 ● Copyright © 1997–2021 Nanosurf AG ● AGB / GTC ● Data Privacy Policy

Follow us on: