AFSEM™ webinar (March 15, 2017)

Introducing the leading solution for correlative AFM-SEM-EDX analysis

The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.

This recorded webinar by Nanosurf and GETec explores the recent advances in correlative AFM-SEM-EDX analysis and shows how to combine these techniques in an interactive experiment.

Topics covered include:

Introduction and overview of the AFSEM™ system
Compatibility to existing SEMs and additional add-ons
(e.g. tensile stages or nanoindenters)
Recent application advances
(e.g. in-situ roughness and conductivity analysis,
correlative SEM/EDX/AFM, 3D tomography)

Experts answer application and instrumentation questions by viewers towards the end of the video.

For more Nanosurf videos, please check out our other videos or visit our YouTube channel.

Other Nanosurf videos