Introducing the leading solution for correlative AFM-SEM-EDX analysis
The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.
This recorded webinar by Nanosurf and GETec explores the recent advances in correlative AFM-SEM-EDX analysis and shows how to combine these techniques in an interactive experiment.
Topics covered include:
| Introduction and overview of the AFSEM™ system | |
| Compatibility to existing SEMs and additional add-ons (e.g. tensile stages or nanoindenters) |
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| Recent application advances (e.g. in-situ roughness and conductivity analysis, correlative SEM/EDX/AFM, 3D tomography) |
Experts answer application and instrumentation questions by viewers towards the end of the video.
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