What Nanosurf customers are saying
Dr. Thilo Glatzel
As a long-time Nanosurf customer, I highly value Nanosurf’s exceptionally fast and competent expert-level support. They were of great help in ironing out technical issues with our initial glovebox implementation and responded quickly and positively to all of my requests.
Dr. Mustapha Mabrouki
I bought the first FlexAFM ever sold in Morocco. We chose this instrument as it best fulfils our research requirements at great value for money. During the initial phase, we much appreciated the competence of Nanosurf’s technical sales team and the friendly relationship that d...
Prof. Tahar Touam
I purchased my first Nanosurf Flex-Axiom AFM system when I was at Annaba University (Algeria) in 2015 and was very satisfied with its capabilities. After taking a new position at the Research Unit in Optics and Photonics of the Centre for Development of Advanced Technologies ( ...
Dr. Philipp Merkelbach
We contacted Nanosurf with a problem and they showed us the solution: we needed to measure samples on an existing inverted optical microscope as well as by AFM. Nanosurf solved the issue by designing a shuttle stage with a repositioning accuracy of > 20 µm.
Dr. Wesley C. Sanders
For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research projects and demonstrations. These AFMs have provided us with years of exceptional use. They have allowed students to acquire complex skill sets associated with AFM imag...
News
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Alphacen 300 large sample AFM system operational at MRS Fall
After a tight delivery schedule and a few hours of assembly, the brand new Alphacen 300 system is up and running at the Nanosurf booth at MRS Fall.
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Alphacen 300 to be unveiled at MRS Fall
Nanosurf is exhibiting at the 2019 MRS Fall Meeting & Exhibit this week. Visit us at booth #1018 to get an exclusive demonstration of our new AFM system for large and heavy samples: The Alphacen 300!
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Video competition: show atoms in under 10 minutes
Win an elegant Swiss watch! Show us how you measure atoms with a Nanosurf scanning tunneling microscope. From preparation to showing atoms in 10 minutes. Show us your skills with a Nanosurf STM for a chance to wi...
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How much does an AFM cost?
The answer to the question how much an atomic force microscope (AFM) costs is always "it depends". The pricing of scanning probe microscopes is influenced by many factors, like the performance, capabilities and modes yo...
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Conductive AFM (C-AFM) measurements on a polished IC surface with multiple transistor contacts
Introduction Chemical-mechanical polishing (CMP) is a standard manufacturing process employed in the semiconductor industry during the fabrication of integrated circuits and memory disks. When the goal is to flatte...
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NaioSTM used in high external-efficiency nanofocusing for lens-free near-field optical nanoscopy
Researchers from the University of California demonstrated a two-step sequential nanofocusing technique to achieve high-efficiency, broadband and dual-directional nanofocusing for near-field optical excitation and spect...
Events
AFM Theory: Learn how AFM works and all about AFM modes
Due to its flexibility, the atomic force microscope has become a common tool for material characterization alongside optical and electron microscopy, achieving resolutions down to the nanometer scale and beyond. The AFM can operate in environments from ultra-high vacuum to fluids, and therefore cuts across all disciplines from physics and chemistry to biology and materials science. This article describes the operating principle and most common measurement modes of atomic force microscopy, and some of the many properties that can be measured with AFM on the nanoscale.
