What Nanosurf customers are saying
Prof. Dr. Nancy Burnham
The NaioAFM allows new users to acquire meaningful AFM images and data in as little as two hours. In the context of a highly time-constrained course, when perhaps only a total of twelve lab hours are planned, this efficiency is a significant advantage over many other atomic fo...
Dr. Wesley C. Sanders
For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research projects and demonstrations. These AFMs have provided us with years of exceptional use. They have allowed students to acquire complex skill sets associated with AFM imag...
Prof. Tahar Touam
I purchased my first Nanosurf Flex-Axiom AFM system when I was at Annaba University (Algeria) in 2015 and was very satisfied with its capabilities. After taking a new position at the Research Unit in Optics and Photonics of the Centre for Development of Advanced Technologies ( ...
Dr. Philipp Merkelbach
We contacted Nanosurf with a problem and they showed us the solution: we needed to measure samples on an existing inverted optical microscope as well as by AFM. Nanosurf solved the issue by designing a shuttle stage with a repositioning accuracy of better than...
Dr. Mustapha Mabrouki
I bought the first FlexAFM ever sold in Morocco. We chose this instrument as it best fulfils our research requirements at great value for money. During the initial phase, we much appreciated the competence of Nanosurf’s technical sales team and the friendly relationship that d...
News
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KPFM mode operation
Tutorial: Setting up and performing a KPFM measurement This tutorial guides you through KPFM operation on a Nanosurf AFM.
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Dr. James Berwick joins Nanosurf as Head of Sales, Marketing & Service
Nanosurf is proud to announce the addition of James Berwick as the new Head of Sales, Marketing and Service. He will be based in our headquarters in Liestal, Switzerland. James will manage the global sales and marketing...
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Nanosurf introduces a cutting-edge tip-scanning atomic force microscope
Nanosurf, a global provider of scanning probe microscopes, has launched the DriveAFM — a high-performance tip-scanning AFM that incorporates innovative technologies. The DriveAFM was is designed to achieve high-resoluti...
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Magnetic force microscopy (MFM)
Magnetic force microscopy (MFM) is one of the modes of scanning probe microscopy (SPM). As the name suggests, it is used for mapping magnetic properties. MFM probes local magnetic fields on the nanoscale, resulting in i...
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Nanosurf webinars and live demonstrations
Nanosurf regularly holds webinars on topics of interest to our industry as well as live demonstrations of Nanosurf AFMs. All these events are free of charge and open to everyone. We hope to be able to provide you with a...
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Nanosurf awarded patent on a novel optical guiding mechanism for tip-scanning AFM
Nanosurf AG, a global nanotechnology company that focuses on developing scanning probe microscopes and other related technologies, was awarded US Patent 10,564,181 by the United States Patent and Trademark Office for a...
AFM Theory: Learn how AFM works and all about AFM modes
Due to its flexibility, the atomic force microscope has become a common tool for material characterization alongside optical and electron microscopy, achieving resolutions down to the nanometer scale and beyond. The AFM can operate in environments from ultra-high vacuum to fluids, and therefore cuts across all disciplines from physics and chemistry to biology and materials science. This article describes the operating principle and most common measurement modes of atomic force microscopy, and some of the many properties that can be measured with AFM on the nanoscale.
