What Nanosurf customers are saying
Dr. Paul S. Keatley
The unique combination of compact design, optical access, and intuitive operation of the LensAFM made it the perfect platform for our instrument development. We believe that much of the success of our project has been achieved through the excellent communicatio...
Dr. Thilo Glatzel
As a long-time Nanosurf customer, I highly value Nanosurf’s exceptionally fast and competent expert-level support. They were of great help in ironing out technical issues with our initial glovebox implementation and responded quickly and positively to all of my requests.
Dr. Wesley C. Sanders
For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research projects and demonstrations. These AFMs have provided us with years of exceptional use. They have allowed students to acquire complex skill sets associated with AFM imag...
Prof. Dr. Nancy Burnham
The NaioAFM allows new users to acquire meaningful AFM images and data in as little as two hours. In the context of a highly time-constrained course, when perhaps only a total of twelve lab hours are planned, this efficiency is a significant advantage over many other atomic fo...
Prof. Tomaso Zambelli
At the Laboratory of Biosensors and Bioelectronics (ETH Zurich) we have been using the Nanosurf’s Flex-FPM system since the very early days of FluidFM®. Together with Cytosurge, SmartTip and Nanosurf we developed this technology establishing several applications from cell adhe...
News
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Nanosurf awarded patent on a novel optical guiding mechanism for tip-scanning AFM
Nanosurf AG, a global nanotechnology company that focuses on developing scanning probe microscopes and other related technologies, was awarded US Patent 10,564,181 by the United States Patent and Trademark Office for a...
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Webinar: Automated nanomechanical analysis of blended polymers
Automated nanomechanical analysis of blended polymers Speaker: Dr. Edward Nelson In this webinar Dr. Edward Nelson discusses Nanosurf's automated nanomechancial analysis module and explains its application in...
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Webinar: Choosing between scanning probe and scanning electron microscopy
Choosing between scanning probe and scanning electron microscopies Speaker: Dr. Dalia Yablon This webinar will discuss three of the most popular high-resolution microscopy-based methods that provide nanoscale...
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End of 2020 special offers
End of year special offer We are offering a special end-of-year promotion on CoreAFM. All purchases of CoreAFM before the end of the year will be eligible to receive two advanced modes of your choice, worth about...
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Evaluation of electrical and magnetic signals in heat resistant alloys
A team of materials science researchers led by G.R. Pereira at the Federal University of Rio de Janeiro in Brazil used KPFM and MFM to evaluate heat resistant steel alloys as a function of aging. The various steel sampl...
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Dominik Ziegler joins Nanosurf as the Chief Technology Officer
Nanosurf is proud to announce the addition of Dominik Ziegler to our development and management teams at our headquarters in Switzerland. As CTO he will be responsible for all research and product development activities...
AFM Theory: Learn how AFM works and all about AFM modes
Due to its flexibility, the atomic force microscope has become a common tool for material characterization alongside optical and electron microscopy, achieving resolutions down to the nanometer scale and beyond. The AFM can operate in environments from ultra-high vacuum to fluids, and therefore cuts across all disciplines from physics and chemistry to biology and materials science. This article describes the operating principle and most common measurement modes of atomic force microscopy, and some of the many properties that can be measured with AFM on the nanoscale.
