Alessandro Pitanti, Mingyun Yuan, Simone Zanotto, and Paulo Ventura Santos, Phys. Rev. Applied 20, 054054 (2023)
Publications
The ultimate tool for nanoscale research from biological molecules to advanced new materials.
The versatile mid-range research AFM that grows with your demands in modes and accessories.
A compact affordable research AFM that is astoundingly easy to use, with more than 30 modes and options.
Fastest reliable sub-Angstrom surface roughness metrology.
Measure roughness and other material properties of heavy and large samples up to 300 mm and 45 kg.
For unique requirements, we will design a bespoke AFM solution, leveraging our decades of engineering expertise.
Slide an AFM onto your upright optical microscope turret for a leap in resolution.
One of the smallest ever AFMs, created for integration into custom stages or existing setups.
A flexibly mountable research-grade scan head for integration into custom stages or existing set ups.
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Publications
Alessandro Pitanti, Mingyun Yuan, Simone Zanotto, and Paulo Ventura Santos, Phys. Rev. Applied 20, 054054 (2023)
Publications
Alessandro Pitanti, Mingyun Yuan, Simone Zanotto, and Paulo Ventura Santos, Phys. Rev. Applied 20, 054054 (2023)
Publications
Alessandro Pitanti, Mingyun Yuan, Simone Zanotto, and Paulo Ventura Santos, Phys. Rev. Applied 20, 054054 (2023)
Publications
Alessandro Pitanti, Mingyun Yuan, Simone Zanotto, and Paulo Ventura Santos, Phys. Rev. Applied 20, 054054 (2023)