The Essential AFM for Custom Integration

Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM. The result is a tip-scanning AFM that can easily be attached to one of Nanosurf’s large, custom-built motorized translation stages and is thus able to characterize the surface of samples with weights and dimensions virtually no other AFM system can handle.

  • Proven performance and reliability in industrial settings
  • Tip scanning design for maximal flexibility
  • Automation capabilities
  • Purpose-built for integration
  • Measure samples of any weight and dimensions
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Research-Grade Scan Head for Integration

Flex-Mount is based on the FlexAFM, Nanosurf’s most widely used research scan head. The flexure-based tip scanner provides flat and linear scanning, high resolution, and stable operation.


Unlimited Freedom with Custom Stages

Get the ideal automated AFM solution designed for your application, or integrate the Flex-Mount with your existing stage system. Nanosurf is the leading provider of integration solutions and custom developments for industrial customers with highly specific requirements.

Large, Non-Planar, and Curved Samples

Flex-Mount, in combination with the right stage, will provide you with precise measurements on samples of any size. Tilting of the scan head, coupled with freedom of movement in any axes you require, will allow you to reach any sample area of interest easily also on curved samples.

Flex-Mount Features

Self-Aligning Cantilevers

24-bit Controller

Large Range of AFM Modes

Flat and Linear Scanner

100 μm Scan Range

Custom Stages

Easy to Use

Top- and Sideview Camera

No Sample Limitations

Flex-Mount Imaging Modes

Standard imaging modes

  • Static Force Mode
  • Lateral Force Mode
  • Dynamic Force Mode (Tapping Mode)
  • Phase Imaging Mode

Electrical properties

  • Conductive AFM (C-AFM)
  • Scanning Spreading Resistance Microscopy (SSRM)
  • Piezoelectric Force Microscopy (PFM)
  • Electrostatic Force Microscopy (EFM)
  • Kelvin Probe Force Microscopy (KPFM)
  • Scanning Microwave Microscopy (SMM)
  • Magnetic Force Microscopy (MFM)

Mechanical properties

  • Force Spectroscopy (Unfolding and Stretching, Adhesion)
  • Force Modulation
  • Force Mapping (Stiffness and Modulus, Adhesion)

Lithography and Nanomanipulation

Electrochemical AFM (EC-AFM)

Scanning Thermal Microscopy (SThM)

C3000 Control Software

The control software for the Nanite is an intuitive platform made for performing your AFM measurements efficiently and easily. Simply choose the cantilever you are using, and the system automatically performs the frequency sweep prior to approaching the sample. No manual setting of parameters is required. A selection of measuring tools allows you to accurately measure angles and distances directly on the acquired measurement image. 

  • Cantilever calibration by Sader method and frequency sweep
  • Highly configurable graph area with mode-dependent auto-layout: the software automatically shows the relevant graphs and information
  • Easy file handling with comfort features: auto apply naming conventions, Windows Explorer integration, image gallery, bulk renaming.
  • Includes a powerful scripting interface: automate and extend capabilities according to your needs.
  • Compatible with most programming environments (e.g. LabView, Python, MatLab, C++, Java, and more)
  • Spectroscopy wizard: follow easy steps to set up spectroscopy measurements
  • One software UI for all scan heads: no additional learning curve if you use multiple Nanosurf AFM systems
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Download the Flex-Mount Brochure

The PDF brochure includes details on the Flex-Mount technology, application examples for different areas of interest and system specifications.

Download Brochure

Integration Examples

Motorized XYZΦ translation stage for extra large samples
Description Specification
Max. Traverse path X/Y/Z/Φ: 230/485/20 mm / 360°
Step size X/Y/Z/Φ: 0.5/0.5/0.5 µm / 0.001°
Step size X/Y/Z/Φ: 0.5/0.5/0.5 µm / 0.001°
Repositioning accuracy: ± 1/1/1 µm / 0.001°
Absolute accuracy: ± 15 µm
Max. velocity: 30/30/3 mm/s / 7°/s
Sample platform size: ⌀500 mm
Sample size: ⌀500 mm × 80 mm
Sample weight: max. 20 kg
Stage size: 1350 mm × 950 mm × 1360 mm
Stage weight: 1300 kg
Stage technology: Linear motors, spindle-stepper motor, harmonic drive, air bearings
Noise level: < 40 pm
Motorized XYZΦ translation stage for extra large samples

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Interested in Flex-Mount?

Get to know the Flex-Mount! Reach out to us to discuss your application with one of our AFM experts, discuss your needs for a budgetary quote or schedule an exploratory meeting to learn more about integration possibilities. 

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