NaioAFM - The Leading AFM for Nanoeducation

The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.

  • All-in-one plug-and-play AFM system
  • All standard operating modes
  • Famously easy to use
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All-in-One Plug-and-Play AFM System

The NaioAFM system consists of only the scan head mounted on a small vibration isolation platform with integrated controller. It takes only a few minutes to set up and prepare for a measurement. Ideal for a university course or classroom setting, the NaioAFM is robustly designed and insensitive to careless handling by novice users, yet performs well on a large variety of samples.  


All Standard Operating Modes

NaioAFM boasts a versatile selection of measurement modes, despite its basic design. NaioAFM is capable of measuring in all standard operating modes, and it can even perform basic electrical characterization and basic force spectroscopy. If you are learning AFM, or require only basic AFM functionality for your research, the NaioAFM has been the instrument of choice for more than a decade.


NaioAFM Enclosure

It Only Takes 10 Minutes to Learn

The NaioAFM is the easiest-to-use atomic force microscope ever built. With built-in handling support like the cantilever alignment chip, you don’t even need perfectly steady hands to set up this AFM for measurement. It doesn’t even require laser alignment – just connect everything, place a cantilever and your sample, and you’ll have your first results in minutes.

Prof. Dr. Nancy Burnham

"The NaioAFM allows new users to acquire meaningful AFM images and data in as little as two hours. In the context of a highly time-constrained course, when perhaps only a total of twelve lab hours are planned, this efficiency is a significant advantage over many other AFMs, for which the time commitment might be two or three times greater."



NaioAFM Features


Simple cantilever exchange: no laser or detector adjustment required. Ideal for hands-on learning of AFM.


Integrated high-resolution camera for top and side view sample observation.


Designed with classroom settings and small budgets in mind.


Feature-complete: all standard operating modes available.


Integrated controller, XY-table, airflow shielding, and vibration isolation.


No system setup needed: just plug into your PC, power up, and start the software.

Dr. Wesley C. Sanders

Salt Lake Community College

"For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research projects, and for demonstrations. These AFMs have provided us with years of exceptional use. They have allowed students to acquire complex skill sets associated with AFM imaging with great ease. The efficient design of the AFM hardware and the user-friendly software has been ideal for students enrolled in our semester-long AFM course. In addition to high-quality instrumentation, Nanosurf scientists have provided us with fast and outstanding service. I highly recommend using Nanosurf AFMs for educational, training, and research purposes."


AFM Modes

Standard imaging modes

  • Static Force Mode
  • Dynamic Force Mode (Tapping Mode)
  • Phase Imaging Mode

Magnetic properties

  • Magnetic Force Microscopy (MFM)

Electrical properties

  • Conductive AFM (C-AFM)
  • Electrostatic Force Microscopy (EFM)

Mechanical properties

  • Force Spectroscopy
  • Force Modulation
  • Stiffness and Modulus
  • Adhesion
  • Force Mapping

Other measurement modes

  • Lithography and Nanomanipulation

NaioAFM Control Software

The control software for the NaioAFM is an intuitive platform made for performing your AFM measurements efficiently and easily. Simply choose the cantilever you are using, and the system automatically performs the frequency sweep prior to approaching the sample. No manual setting of parameters is required. A selection of measuring tools allows you to accurately measure angles and distances directly on the acquired measurement image.

  • Cantilever calibration by Sader method and frequency sweep
  • Highly configurable graph area with mode-dependent auto-layout: the software automatically shows the relevant graphs and information
  • Easy file handling with comfort features: auto apply naming conventions, Windows Explorer integration, image gallery, bulk renaming.
  • Includes a powerful scripting interface: automate and extend capabilities according to your needs.
  • Compatible with most programming environments (e.g. LabView, Python, MatLab, C++, Java, and more)
  • Spectroscopy wizard: follow easy steps to set up spectroscopy measurements
  • One software UI for all scan heads: no additional learning curve if you use multiple Nanosurf AFM systems
Learn More

Download the NaioAFM Brochure

The PDF brochure includes details on the NaioAFM's technology, application examples for different areas of interest and system specifications.

Download PDF

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Interested in NaioAFM?

Get to know the NaioAFM! Reach out to us to discuss your application with one of our seasoned AFM experts, to get a budgetary quote or schedule a product demonstration or exploratory meeting. 

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