Alphacen 300
The Tip-Scanning AFM for Heavy and Large Samples
The Alphacen 300 system is a unique AFM solution that can handle large and heavy samples with ease. It features the Flex-Mount scan head, which has a tip-scanner design that enables high-performance imaging regardless of the sample size or weight. The CX controller, Nanosurf's most advanced AFM controller, offers fast and precise control over the scan process. The dedicated acoustic enclosure reduces external noise and vibrations. Moreover, the system can be further customized with additional translation or rotation axes to suit your specific sample.
No other AFM system offers such versatility and functionality.
- Tip scanner design ensures high-quality imaging regardless of sample size or weight
- Samples up to 300 mm x 300 mm and 45 kg
- A dedicated acoustic enclosure to minimize external noise and vibrations
- Can serve as basis for custom solutions
Research-Grade Tip-Scanning Design
Using the proven research scan head technology from Nanosurf’s FlexAFM, the Alphacen 300 delivers high-quality imaging and reliable performance. The scanner features a flexure-based tip design that ensures flat and linear scanning, high resolution, and stable operation.
Large and Heavy Samples
The Alphacen 300 is a tip-scanning AFM that can handle large and heavy samples with ease. You can measure samples up to 300 mm x 300 mm in size and up to 45 kg in weight with this device. The 50 mm z approach stage also enables you to mount thick samples without any hassle.
AFM System Automation
With the Alphacen 300 system, you can customize your automation scripts to suit your specific needs, beyond the built-in automation options in the AFM software. Moreover, automate not only your measurements, but integrate your AFM system into a larger automation concept. Our specialized Nanosurf Automation Software Solutions team will help you take your measurement workflows into the era of industry 4.0.
Unlimited Freedom with Customization
The Alphacen 300 is a standard AFM system that can serve as the basis for a custom-engineered solution. Whether you need precise sample rotation for consistent feature alignment or accommodation for samples beyond 300 mm, the Alphacen 300 can adapt to your unique requirements with its versatile stage system and customizable rotation axes of both sample positioning system and scan head.
Download the Alphacen 300 Brochure
The PDF brochure includes details on the Alphacen 300's technology, application examples for different areas of interest and system specifications.
Alphacen 300 Example Measurements
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Get to know the Alphacen 300! Reach out to us to discuss your application with one of our seasoned AFM experts, to get a budgetary quote or schedule a product demonstration or exploratory meeting.
