Alphacen 300

The Tip-Scanning AFM for Heavy and Large Samples 

The Alphacen 300 system is a unique AFM solution that can handle large and heavy samples with ease. It features the Flex-Mount scan head, which has a tip-scanner design that enables high-performance imaging regardless of the sample size or weight. The CX controller, Nanosurf's most advanced AFM controller, offers fast and precise control over the scan process. The dedicated acoustic enclosure reduces external noise and vibrations. Moreover, the system can be further customized with additional translation or rotation axes to suit your specific sample.

No other AFM system offers such versatility and functionality.

  • Tip scanner design ensures high-quality imaging regardless of sample size or weight
  • Samples up to 300 mm x 300 mm and 45 kg
  • A dedicated acoustic enclosure to  minimize external noise and vibrations
  • Can serve as basis for custom solutions
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Research-Grade Tip-Scanning Design

Using the proven research scan head technology from Nanosurf’s FlexAFM, the Alphacen 300 delivers high-quality imaging and reliable performance. The scanner features a flexure-based tip design that ensures flat and linear scanning, high resolution, and stable operation.


Large and Heavy Samples

The Alphacen 300 is a tip-scanning AFM that can handle large and heavy samples with ease. You can measure samples up to 300 mm x 300 mm in size and up to 45 kg in weight with this device. The 50 mm z approach stage also enables you to mount thick samples without any hassle.


AFM System Automation

With the Alphacen 300 system, you can customize your automation scripts to suit your specific needs, beyond the built-in automation options in the AFM software. Moreover, automate not only your measurements, but integrate your AFM system into a larger automation concept. Our specialized Nanosurf Automation Software Solutions team will help you take your measurement workflows into the era of industry 4.0. 


Unlimited Freedom with Customization

The Alphacen 300 is a standard AFM system that can serve as the basis for a custom-engineered solution. Whether you need precise sample rotation for consistent feature alignment or accommodation for samples beyond 300 mm, the Alphacen 300 can adapt to your unique requirements with its versatile stage system and customizable rotation axes of both sample positioning system and scan head.


Alphacen 300 Features

Easy to Use

Flat and Linear Scanning

Large Range of AFM Modes

Self-Aligning Cantilevers

24-bit CX Controller

Standard System with Customizing Options

Top- and Sideview Camera

100 μm Scan Range 

No Sample Limitations

Alphacen 300 Operating Modes

Standard imaging modes

  • Static Force Mode
  • Lateral Force Mode
  • Dynamic Force Mode (Tapping Mode)
  • Phase Imaging Mode

Electrical properties

  • Conductive AFM (C-AFM)
  • Scanning Spreading Resistance Microscopy (SSRM)
  • Piezoelectric Force Microscopy (PFM)
  • Electrostatic Force Microscopy (EFM)
  • Kelvin Probe Force Microscopy (KPFM)
  • Magnetic Force Microscopy (MFM)

Mechanical properties

  • Force Spectroscopy 
  • Force Modulation
  • Force Mapping 

Lithography and Nanomanipulation

Electrochemical AFM (EC-AFM)

Scanning Thermal Microscopy (SThM)

Nanosurf C3000 Software

  • Established software solution for all Nanosurf AFM systems
  • Automatic, parameter-free frequency tuning based on cantilever characteristics
  • Distance and surface roughness measurement tools
  • Automated deflection sensitivity calibration and Force Spectroscopy wizard
  • Easy to learn for novice users, all the flexibility for the expert user
  • Instrument control is fully scriptable
  • Free lifetime updates
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Download the Alphacen 300 Brochure

The PDF brochure includes details on the Alphacen 300's technology, application examples for different areas of interest and system specifications.

Download Brochure

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Interested in Alphacen 300?

Get to know the Alphacen 300! Reach out to us to discuss your application with one of our seasoned AFM experts, to get a budgetary quote or schedule a product demonstration or exploratory meeting. 

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