Low current measurement on HOPG

Conductive AFM (cAFM) is becoming a very important analytical tool in the semiconductor industry. Doping, electrical conductivity, surface potential and current flow are only some examples of cAFM. Continuous improvement and development on this technique to expand its capabilities and increase its sensibility is an essential aspect.

Low current cAFM measurement on HOPG. 500nm x 500nm; z-range 80pA
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