Dynamic force AFM of lens surface

High-tech applications demand an extremely low surface roughness of modern optical systems. The AFM is uniquely suitable for measurement of the roughness of such surfaces.

1x1µm image, z-range: 0.8nm

The image shows a lens surface.
The measurement was done in "Dynamic Force" operating mode.

View application note (PDF)

While you are here – are you interested in learning more about AFM?

Nanosurf regularly holds free webinars and live demonstrations about applications, modes, and AFM instruments. To plan our future offerings, please take a moment to let us know which of the following topics you would be interested in.

Generated with MOOJ Proforms Version 1.5
*Required information.

Other Nanosurf applications