Dynamic mode AFM of polished sapphire

For some applications, sapphire or glass surfaces need to be polished down to sub-nanometer roughness. The images obtained here show polishing marks in and small contamination particles on the surface.

Image of polished sapphire

Image was recorded in dynamic mode. System: NaniteAFM with 10µm scan range connected to a C3000 controller Cantilever: NCLAuD (Nanosensors) Image processing: Nanosurf Report software Sa = 0.12nm
The particles on the surface cause large values for the skewness and kurtosis of 49 and 2770, respectively.

Profile showing the depth of scratches

The profile shows the sub-nanometer depth from the polishing marks. The profile was generated with Gwyddion software, taking the average of 4 adjacent pixels.

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Industrial solutions

In addition to our standard products we can design and develop custom-built atomic force microscope systems, stages, and parts. A dedicated team of highly qualified engineers is ready to create the optimal solution for your industrial application. For a first impression of what we can do, have a look at these examples.

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Flex-Axiom — AFM for materials research

By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of materials research applications to be handled with ease. Together with the powerful C3000 controller, complex material characterizations are possible.

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Flex-Bio — AFM for biology and life science

A key success factor in life science research is the combination of multiple techniques. With the Flex-Bio, Nanosurf's Bio AFM, you can combine the AFM imaging, spectroscopy and nanomanipulation capabilities of this system with the high-end optical imaging techniques available for inverted microscopes.