Topography of solar cell layers

Substrate roughness has a large effect on all aspects of pc-Si solar cell processes.

A smoother substrate leads to a bigger grain size in the absorber layer and to an increase in generated voltage and efficiency of the resulting solar cells.

 Scan range 90µm x 90µm; Z range 7.6µm

AFM can provide precise,
qualitative and quantitative roughness
measurements of surfaces.
The image shows the topography of the
P-doped polycrystalline-Si layer of a solar cell.

View application note (PDF)

Other Nanosurf applications