The compact research AFM that offers best value for money
The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness. Due to this fundamental design approach, the CoreAFM is equipped to perform AFM at its best.
The fusion of a modern flexure-guided scanner, XYZ sample stage, camera, active vibration isolation table, and airflow shielding in a single all-in-one unit results in a complete AFM system with an unparalleled compact footprint. The system comes with a fully digital 24-bit controller developed specifically for the CoreAFM scanhead. All the essential functions of modern AFM are integral components of the CoreAFM system; all you need to do to take the CoreAFM into operation is connect the controller, and plug in power and USB.
Easy setup and handling
See for yourself how easy it is to prepare and operate the CoreAFM. Watch the video for a demonstration of the main features, and a brief tutorial on how to perform a measurement using this system.
Spike-Guard
Deeper system integration of the Isostage is reflected in the unique Spike-Guard, which eliminates glitches during imaging. Although the Isostage is an active vibration isolation system, glitches can still occur when distortions are too severe. Spike-Guard detects such anomalies and rescans the line for a distortion-free image.
Powerful and versatile
State of the art electronics with 24-bit ADC and DAC ensure high-resolution XYZ driving of the 100×100×12 µm scanner and allow for low-noise force detection limited only by the cantilever. Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended.
A closed scanner compartment features acoustic and air current isolation, while sample stage positioners still allow you to adjust your sample
When the scanner compartment is opened, it provides access to the scanner and sample stage, e.g. to place a new sample for measurement
AFM Modes
CoreAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us directly.
Standard imaging modes
Static Force Mode
Lateral Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Magnetic properties
Magnetic Force Microscopy
Electrical properties
Conductive AFM (C-AFM)
Piezoelectric Force Microscopy (PFM)
Electrostatic Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KPFM)
Mechanical properties
Force Spectroscopy
Force Modulation
Stiffness and Modulus
Adhesion
Unfolding and Stretching
Force Mapping
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
Included measurement modes
The CoreAFM can perform static force, dynamic force, phase imaging, MFM, lateral force, force modulation, standard spectroscopy, and standard lithography out of the box. You can however enhance your measurement experience with CoreAFM mode kits.
Included standard mode kits
By default, the CoreAFM comes with the static force mode kit, dynamic force mode kit, and phase imaging mode kit to get you started right away. Depending on the measurement mode, a mode kit may include samples, suitable cantilevers, accessories, or a combination thereof.
Thirty-two standard and optional modes with fully compatible add-ons make the CoreAFM the tool of choice for applications ranging from materials research to life science and electrochemistry. Starting from the basic CoreAFM system, its functionality can be seamlessly extended. Advanced AFM modes and functionality like sample heating, environmental control, scripting, and many others can easily be added to your CoreAFM. For details and dependencies, see the overview graphic.
Enhance the CoreAFM's FluidFM® functionality with the Digital Inverted Microscope Option
The CoreAFM is a very versatile atomic force microscope that can be used for a multitude of different types of research. The DIMO
enhances your CoreAFM to allow optical view from below, replacing the need for a completely different AFM setup with an inverted
microscope.
Enhanced viewing ability
Nanosurf has a long-standing collaboration with Cytosurge and has been developing FluidFM® solutions for FlexAFM since 2011, offering powerful applications for single cell analysis and manipulation. The DIMO upgrades the CoreAFM to also be capable of performing FluidFM®. It enhances your capabilities when using accessories like the petri dish holder (shown to the right).
The minimalist and integrated design eliminates the need for additional acoustic shielding, camera housing, and so on, thus making every remaining component essential to its function. Less is more — in the case of the CoreAFM, more value for your money.
The CoreAFM and its accessories have been designed as part of a consistent system concept.
Example of the design and thought processes that went into the development of CoreAFM accessories, all leading to lower overall costs and higher general reusability
The result is an integrated, high-quality, high-performance, and versatile AFM system that offers the best price-to-performance ratio on the market. An atomic force microscope that is easy to use, robust, and easily extendable.
The CoreAFM brings you back to the essence of AFM: the measurement, not the machine!
Graphene belongs to the category of 2D materials and is of interest in the research and development of new devices and materials. Besides atomic resolution imaging of graphene to learn more about crystal orientation, edges and defects, the functional properties of graphene are also of great interest.
In this application note, multilayer graphene was imaged with Kelvin probe force microscopy (KPFM) using a CoreAFM to study the contact potential difference variation on a single flake.
Optical image recorded on an upright microscope with a 50x NA0.9 objective Inset: area where KPFM data and AFM images of graphene were recorded
Topview image of same area in CoreAFM
Multilayer graphene flakes were generated by mechanical exfoliation of graphite and subsequent transfer to a silicon-silicondioxide substrate. The KPFM measurement was carried out in single-run mode, recording the contact potential during the scanning of the topography.
Thin flakes were localized on the substrate with an upright microscope. Using markers on the substrate, the same flakes were placed under the cantilever using the topview camera of the CoreAFM, after which AFM images of graphene and KPFM data were recorded.
Overlay of contact potential difference on an AFM topography image of a multilayer graphene flake.
Sample courtesy: Hiske Overweg, Klaus Ensslin, ETH Zürich, Switzerland
All measurements were performed using a CoreAFM system equipped with a PPP-EFMR cantilever from Nanosensors. AFM images of graphene were processed using the MountainsMap SPM.
Out of plane piezoresponse force microscopy (PFM) on Lithium Niobate
Lithium Niobite (LiNbO3) is an optically transparent, piezo responsive material used, for example, in piezo sensors or in mobile phones.
We tested a LiNbO3 sample (PFM03, obtained from TipsNano, Estonia) with CoreAFM. The sample has a regular domain structure with 10-µm period. The spontaneous polarization has the opposite direction in the neighboring domains.
To measure the piezoresponse during imaging, a 7.5 V AC voltage was applied to the cantilever while raster scanning the tip over the sample. In response to the applied voltage, the sample periodically expands and shrinks, either in phase with or in counter phase to the excitation frequency. Despite a small measured RMS roughness of 0.3 nm, the domains could not be recognized in the topography. The domains could however be readily identified in the out of plane piezoresponse.
Lithium Niobite (LiNbO3) is an optically transparent, piezo responsive material used, for example, in piezo sensors or in mobile phones. We tested a LiNbO3 sample (PFM03, obtained from TipsNano, Estonia) with CoreAFM. The sample has a regular domain structure with 10-µm period. The spontaneous polarization has the opposite direction in the neighboring domains.
PFM on Lithium Niobate
To measure the piezoresponse during imaging, a 7.5 V AC voltage was applied to the cantilever while raster scanning the tip over the sample. In response to the applied voltage, the sample periodically expands and shrinks, either in phase with or in counter phase to the excitation frequency. Despite a small measured RMS roughness of 0.3 nm, the domains could not be recognized in the topography. The domains could however be readily identified in the out of plane piezoresponse.
