The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples
The leading AFM for nanoeducation
All-in-one plug-and-play AFM system
Famously easy to use
All standard operating modes available
The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
For several years we have used the Easyscan 2 and the NaioAFM to provide AFM training, for student research projects and demonstrations. These AFMs have provided us with years of exceptional use. They have allowed students to acquire complex skill sets associated with AFM imaging with great ease. The efficient design of the AFM hardware and the user-friendly software has been ideal for students enrolled in our semester-long AFM course. In addition to high-quality instrumentation, Nanosurf scientists have provided us with fast and outstanding service. I highly recommend using Nanosurf AFMs for educational, training, and research purposes.
Get started within minutes
To use the NaioAFM, just plug in the power and USB cables, start the user-friendly software, and you're ready to go within minutes! No real setup is required. Check out our overview video to see just how easy this is. Because the NaioAFM comes with a cantilever alignment chip, cantilever exchange is really easy as well, and laser alignment becomes a thing of the past. Watch the cantilever exchange video to see how it's done.
Prof. Dr. Nancy Burnham
"The NaioAFM allows new users to acquire meaningful AFM images and data in as little as two hours. In the context of a highly time-constrained course, when perhaps only a total of twelve lab hours are planned, this efficiency is a significant advantage over many other AFMs, for which the time commitment might be two or three times greater."
NaioAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please view the brochure or contact us directly.
Standard imaging modes
Static Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Magnetic Force Microscopy
Conductive AFM (C-AFM)
Electrostatic Force Microscopy (EFM)
Scanning Spreading Resistance Microscopy (SSRM)
Stiffness and Modulus
Other measurement modes
Lithography and Nanomanipulation
|Max. scan range / scan height (resolution) (1)||70 μm (1.0 nm) / 14 μm (0.2 nm)|
|Static / Dynamic RMS Z-noise||typ. 0.4 nm (max. 0.8 nm) / typ. 0.3 nm (max. 0.8 nm)|
|Max. sample size / height||12 mm / 3.5 mm|
|Max. sample stage positioning range||12 mm travel in each direction (6 mm from center to all sides)|
|Top view camera||3×3 mm FOV, 4× digital zoom, 2 μm optical resolution, 2048×1536 pixels, in-axis LED illumination|
|Side view observation||5×5 mm FOV, variable LED illumination (with optional side view camera: 2×2 mm FOV, 1280×1024 pixels)|
|Approach||4 mm linear motor, continuous or step-bystep approach|
|(1) Manufacturing tolerances are ±10%|
|Width||min. 28 μm|
|Length||min. 225 μm or XY corrected|
|Reflective coating||Required on complete cantilever|
|Liquid measurements||Not possible|
|Resonance frequency dynamic mode||15 kHz to 350 kHz|
|Cantilever shape||Single rectangular cantilevers only|
|Chip thickness||300 μm|