NaioAFM — AFM for small samples

Flex-ANA — AFM for force mapping

All-in-one atomic force microscope for small samples and nanoeducation

The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. More than just the successor of the well-known Easyscan 2 AFM, this all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.


 Key features and benefits

Ready-to-use, table-top AFM
Controller, scan head, airflow shielding, vibration isolation, camera, and sample positioning integrated into a single device
All standard AFM operating modes available
Simple cantilever exchange: no adjustments required
Very competitive pricing



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Imaging of small samples in air
Advanced mechanical, electrical and magnetic modes
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Dynamic measurement modes
Advanced modes
Naio sideview camera
Active vibration isolation
Extended AFM sample kit
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