The smallest AFM for custom integration
The smallest AFM for custom integration
Ideal for custom integration
Automate serial measurements
Copes with large, heavy, or curved samples
The surface morphology is an important property for many high-tech surfaces with features that can go down to a few nanometers and surface roughness below the nanometer. With AFM such features can be readily analyzed under ambient conditions. Most AFMs are limited in the type and size of samples they can handle. The NaniteAFM by Nanosurf is the market leading solution for AFM integration with least restriction to the sample dimensions.
The NaniteAFM has a tip-scanner, two inspection video cameras and an on-board approach motor in an exceptionally small footprint. It contains everything needed to operate independently, paving the way for easy integration: All you need is 300 cm3 in space and a stable docking site to mount the AFM.
Save time thanks to optimized ease of use
The NaniteAFM uses a dovetail mounting plate at the back to allow quick and reproducible mounting. The use of cantilevers with alignment grooves makes laser alignment unnecessary. For integration this guarantees a well-defined offset between the cantilever tip and other components of a setup, for example an indenter. This exceptional accuracy allows switching between the components without searching for the right area, thus reducing off-time and handling during experiments.
The integrated topview camera with 2 µm lateral resolution gives a perfect overview of the surface to localize the areas of interest on the sample and position them under the cantilever. The convenient sideview camera shows the sample under the cantilever at an angle of 45 degrees. It guides the user during the initial fast approach to within a few tens of micrometers of the sample before the AFM takes over for the final automatic approach.
Automation of measurements and analysis
To further minimize the operator time, NaniteAFM can be automated. Through the use of a scripting interface and batch measurement procedures, it is possible to automatically approach and measure samples. The analysis and report generation can also be automated using pre-defined pass-fail criteria. This is particularly powerful in combination with a motorized stage, so multiple areas of a sample or multiple samples can be measured autonomously without operator interference.
The integration capability allows NaniteAFM to handle virtually any sample. Large or heavy samples are no problem, because the NaniteAFM moves while the sample remains in position. Depending on the type of sample, motorization is applied to the tip or the sample, or to both. If a standard solution is not available for your sample, a highly skilled team of engineers and scientists is available to design a custom solution that perfectly fulfils your requirements. Even measurements at different angles can be performed with the appropriate stage.
Quantitative surface analysis at the nanoscale
NaniteAFM is the optimal tool to enhance your imaging and analysis capabilities for quality control, providing nanoscale surface information. It has the advantage that it works equally well for opaque and transparent samples. Because of the latter, AFM has become a well established technique for surface analysis of glass. Some applications require glass surfaces exhibiting a roughness well below the nanometer, and nanometer-sized defects may affect the object's behavior. Despite their surface smoothness, glass objects can be large and heavy, and it is undesirable to cut out samples from a work piece for examination. Finally, glass surfaces are not necessarily plane-parallel, like in the case of lenses. The NaniteAFM is a flexible tool that can handle all requirements to obtain quantitative surface information of a glass work piece.
In parallel to the topography you can visualize other material properties with NaniteAFM: phase information can be used to observe heterogeneity of tip-sample interaction if samples exhibit variations in elastic, adhesive or magnetic properties at the nanoscale. For polymeric samples, the local elasticity and adhesion properties can also be mapped quantitatively in static spectroscopy mode.
NaniteAFM imaging modes
This overview shows which modes the instrument is capable of. Some modes may require additional components or software options. For details, please contact us.
Standard imaging modes
Static Force Mode
Dynamic Force Mode (Tapping Mode)
Phase Imaging Mode
Magnetic Force Microscopy
Conductive AFM (C-AFM)
Electrostatic Force Microscopy (EFM)
Scanning Spreading Resistance Microscopy (SSRM)
Other measurement modes
Lithography and Nanomanipulation
|NaniteAFM scan head specifications||110 µm||70 µm||25 µm|
|Maximum scan range (XY)(1)||110µm||70 µm||25µm|
|Maximum Z-range(1)||22µm||14 µm||5 µm|
|XY-linearity mean error||< 0.6%||< 1.2%||< 0.7%|
|Z-measurement noise level (RMS, static mode)||typ. 350 pm (max. 500 pm)||typ. 350 pm (max. 500 pm)||typ. 80 pm (max. 150 pm)|
|Z-measurement noise level (RMS, dynamic mode)||typ. 90 pm (max. 150 pm)||typ.90 pm (max. 150 pm)||typ. 30 pm (max. 50 pm)|
|Mounting||Removable scan head (86 × 45 × 61 mm) with 3-point quick-lock mounting plate, mountable to Nanosurf or custom stages|
|Alignment of cantilever||Automatic self-alignment for cantilevers with alignment grooves|
|Automatic approach range||4.5 mm (1.5 mm below focal plane of internal optics)|
|Sample observation||Dual USB video camera system (simultaneous top and side view):
5 MP, 1.4 mm x 1 mm, color top view and
5 MP, 3.1 mm x 3.5 mm, color side view of sample and cantilever
|Sample illumination||White LEDs (brightness 0–100%); Axial illumination for top view|
|(1) Manufacturing tolerances are ±10% for the 110-μm scan head and ±15 % for the 70- and 25-μm scan heads
(2) Maximum scan range at 45° scan rotation
|C3000i controller — Core hardware specifications|
|X/Y/Z-axis scan and position controller||3× 24-bit DAC (200 kHz)|
|X/Y/Z-axis position measurement||1× 24-bit ADC (200 kHz)|
|Excitation & modulation outputs||2× 16-bit DAC (20 MHz)|
|Analog signal input bandwidth||0–5 MHz|
|Main input signal capturing||2× 16-bit ADC (20 MHz)
2× 24-bit ADC (200 kHz)
|Additional user signal outputs||1× 24-bit DAC (200 kHz)|
|Digital synchronization||2× digital out, 2× digital in, 2× I2C Bus|
|FPGA module and embedded processor||ALTERA FPGA,
80 MHz, 256 MB RAM,
|Communication||USB 2.0 Hi-Speed to PC and scan head interface|
|System clock||Internal quartz (10 MHz) or external clock|
|Power||90–240 V AC, 70 W, 50/60Hz|
|Width||min. 28 μm|
|Length||min. 225 μm or XY corrected|
|Reflective coating||Required on complete cantilever|
|Liquid measurements||Not possible|
|Resonance frequency dynamic mode||15 kHz to 350 kHz|
|Cantilever shape||Single rectangular cantilevers only|
|Chip thickness||300 μm|