A versatile atomic force microscope integrated with a scanning electron microscope

Review of Scientific Instruments 88, 053704 (2017)

J. Kreith, T. Strunz, E. J. Fantner, G. E. Fantner, and M. J. Cordill

A versatile atomic force microscope (AFM), which can be installed in a scanning electron microscope (SEM), is introduced. The flexible design of the instrument enables correlated analysis for different experimental configurations, such as AFM imaging directly after nanoindentation in vacuum. In order to demonstrate the capabilities of the specially designed AFM installed inside an SEM, several application examples are shown.

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Industrial solutions

In addition to our standard products we can design and develop custom-built atomic force microscope systems, stages, and parts. A dedicated team of highly qualified engineers is ready to create the optimal solution for your industrial application. For a first impression of what we can do, have a look at these examples.

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Flex-Axiom — AFM for materials research

By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of materials research applications to be handled with ease. Together with the powerful C3000 controller, complex material characterizations are possible.

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Flex-Bio — AFM for biology and life science

A key success factor in life science research is the combination of multiple techniques. With the Flex-Bio, Nanosurf's Bio AFM, you can combine the AFM imaging, spectroscopy and nanomanipulation capabilities of this system with the high-end optical imaging techniques available for inverted microscopes.