Frequently asked AFM questions

Get answers to your questions about Atomic Force Microscopy with our 34-page FAQ download. This guide addresses a spectrum of common inquiries, from basic operation to intricate imaging techniques, offering clear explanations and practical tips for both novice and expert users. Whether you're preparing samples, selecting probes, or analyzing mechanical properties, this FAQ is an indispensable resource for anyone working with AFM technology.

 

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Overview of Topics

  • General questions about atomic force microscopy
  • General AFM operation
  • Sample preparation
  • Calibrations for AFM measurements
  • Feedback loop and parameter adjustment
  • General AFM imaging
  • Best practices for force spectroscopy
  • Phase imaging for material contrast
  • Electrical modes
  • Image processing
  • WaveMode 
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Do you still have questions?

Our FAQ document can't cover everything of course. If you have further questions or need more detailed explanations, please get in touch. Our AFM experts are looking forward to discussing your applications with you.  

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