WaveMode: Simple and Fast Imaging With Accurate Force Control

This technical note provides a comprehensive overview of Nanosurf's WaveMode technology. It explains how WaveMode, powered by CleanDrive photothermal excitation, achieves high-speed off-resonance imaging with precise force control, minimizing lateral forces and enhancing resolution. It details the operational advantages of WaveMode, including its ability to perform rapid force-distance measurements by oscillating the cantilever without moving the holder or sample, significantly increasing imaging speed and accuracy.

The technical note also covers the practical aspects of using WaveMode, such as the setup and calibration process, the selection of appropriate cantilevers, and the configuration of imaging parameters using the Nanosurf Studio software.

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Learning Objectives

  1. Understand WaveMode Technology: Learn about the principles of WaveMode and CleanDrive photothermal excitation. Understand how WaveMode achieves high-speed imaging with precise force control.

  2. Operational Advantages: Recognize the benefits of WaveMode in minimizing lateral forces and enhancing resolution. Understand the advantages of rapid force-distance measurements without moving the holder or sample.

  3. Practical Application: Learn how to set up and calibrate WaveMode using the Nanosurf Studio software. Understand the process of selecting appropriate cantilevers and configuring imaging parameters.

  4. Comparison with Other Imaging Modes: Compare WaveMode with static, dynamic, and other off-resonant AFM imaging modes. Understand the superior force control and stability offered by WaveMode.

  5. User-Friendly Features: Explore the user-friendly aspects of the Nanosurf Studio software that simplify WaveMode operation. Learn about automation routines and features that make WaveMode accessible to both novice and experienced users.

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