Nanosurf — Swiss Manufacturer of Atomic Force Microscopes
  • Home
  • Products
    • RESEARCH AFMRESEARCH AFM
    • DriveAFM
    • FlexAFM
    • CoreAFM
    • LensAFM
    • NaioAFM
    • NaioSTM
    • INDUSTRIAL AFMINDUSTRIAL AFM
    • Alphacen 300
    • Customizing
  • Applications
  • Support
    • AFM THEORYAFM THEORY
    • History and Background of AFM
    • AFM Working Principle
    • AFM Modes
      • Contact Modes
      • Dynamic Modes
      • Topography and surface roughness measurements
      • Advanced Modes
      • Magnetic Force Microscopy (MFM)
      • Electrical AFM Modes
      • Conductive AFM (C-AFM)
      • Piezoelectric force microscopy (PFM)
      • Electrostatic force microscopy (EFM)
      • Kelvin probe force microscopy (KPFM)
      • Force Spectroscopy
      • Nanolithography and Nanomanipulation
      • Electrochemical AFM
    • How much does an AFM cost?
    • PUBLICATIONSPUBLICATIONS
    • Google Scholar
    • Featured Publications
    • Other Publications
    • VIDEOSVIDEOS
    • Handling Videos
    • Webinars
    • Interviews
    • SOFTWARESOFTWARE
    • CONTACT SUPPORTCONTACT SUPPORT
  • Company
    • ABOUT USABOUT US
    • News
    • Events
    • Partners
    • PEOPLEPEOPLE
    • AFM Experts
    • Management
    • Board
    • Jobs
    • CONTACTCONTACT
    • Distribution
    • Contact Us
    • Search
    • R&DR&D
    • ARAC
  • Shop

MENU

  • Home
  • Products
    • RESEARCH AFMRESEARCH AFM
    • DriveAFM
    • FlexAFM
    • CoreAFM
    • LensAFM
    • NaioAFM
    • NaioSTM
    • INDUSTRIAL AFMINDUSTRIAL AFM
    • Alphacen 300
    • Customizing
  • Applications
  • Support
    • AFM THEORYAFM THEORY
    • History and Background of AFM
    • AFM Working Principle
    • AFM Modes
    • How much does an AFM cost?
    • PUBLICATIONSPUBLICATIONS
    • Google Scholar
    • Featured Publications
    • Other Publications
    • VIDEOSVIDEOS
    • Handling Videos
    • Webinars
    • Interviews
    • SOFTWARESOFTWARE
    • CONTACT SUPPORTCONTACT SUPPORT
  • Company
    • ABOUT USABOUT US
    • News
    • Events
    • Partners
    • PEOPLEPEOPLE
    • AFM Experts
    • Management
    • Board
    • Jobs
    • CONTACTCONTACT
    • Distribution
    • Contact Us
    • Search
    • R&DR&D
    • ARAC
  • Shop
Contact us
  1. Home
  2. Support
  3. VIDEOS

Nanosurf Videos

Handling videos

  • Opening existing ANA experiments

    Opening existing ANA experiments

  • Importing data in ANA

    Importing data in ANA

  • Static mode operation

    Static mode operation

  • Deflection sensitivity calibration

    Deflection sensitivity calibration

  • Spring constant calibration

    Spring constant calibration

  • Mounting a cantilever

    Mounting a cantilever

  • CoreAFM overview

    CoreAFM overview

  • DIMO - digital inverted microscope option

    DIMO - digital inverted microscope option

  • FlexAFM laser and detector alignment

    FlexAFM laser and detector alignment

  • ECS 204 electrochemical stage – Mounting a rod electrode

    ECS 204 electrochemical stage – Mounting a rod electrode

  • AFSEM™ Introduction

    AFSEM™ Introduction

  • AFSEM™ Integration

    AFSEM™ Integration

  • Tutorials on the use of the NaioAFM at WPI

    Tutorials on the use of the NaioAFM at WPI

  • FluidFM operation – How to store a used cantilever

    FluidFM operation – How to store a used cantilever

  • NaniteAFM on a large custom automated translation stage

    NaniteAFM on a large custom automated translation stage

  • FluidFM operation – Loading of the cantilever

    FluidFM operation – Loading of the cantilever

  • NaioAFM operation – Cantilever exchange

    NaioAFM operation – Cantilever exchange

  • NaioAFM overview

    NaioAFM overview

  • Nanosurf STM overview

    Nanosurf STM overview

  • LensAFM overview

    LensAFM overview

  • FluidFM overview

    FluidFM overview

  • FlexAFM scan head overview

    FlexAFM scan head overview

Webinars

  • Webinar: Automated nanomechanical analysis of blended polymers

    Webinar: Automated nanomechanical analysis of blended polymers

  • Webinar: Choosing between scanning probe and scanning electron microscopy

    Webinar: Choosing between scanning probe and scanning electron microscopy

  • Demo: MFM with the CoreAFM

    Demo: MFM with the CoreAFM

  • Demo: Alphacen 300 - AFM for large and heavy samples

    Demo: Alphacen 300 - AFM for large and heavy samples

  • Demo: KPFM with the CoreAFM

    Demo: KPFM with the CoreAFM

  • Webinar: More than topography: What else can AFM measure?

    Webinar: More than topography: What else can AFM measure?

  • Demo: Force spectroscopy for Nanomechanical measurements

    Demo: Force spectroscopy for Nanomechanical measurements

  • Demo: Imaging 2D Materials with the FlexAFM

    Demo: Imaging 2D Materials with the FlexAFM

  • What is the right instrument for investigating my surface at the nanoscale?

    What is the right instrument for investigating my surface at the nanoscale?

  • Webinar: Single Cell Injection, Deposition and Aspiration

    Webinar: Single Cell Injection, Deposition and Aspiration

  • AFSEM™ webinar (March 15, 2017)

    AFSEM™ webinar (March 15, 2017)

  • Flex-FPM webinar (May 11, 2016)

    Flex-FPM webinar (May 11, 2016)

  • FluidFM webinar (September 25, 2013)

    FluidFM webinar (September 25, 2013)

  • LensAFM webinar

    LensAFM webinar

Interviews

  • Interview with Dr. L.S. Wong & Dr. I.-N. Lee

    Interview with Dr. L.S. Wong & Dr. I.-N. Lee

  • FluidFM interview

    FluidFM interview

About Nanosurf
Distribution Network
Events

How AFM Works
Software Downloads
Videos

AFM & STM Products
AFM Applications
Nanosurf News

Contact Us
Sitemap
Shop

Sign up for our Newsletter
Edit email preferences
Unsubscribe from emails

Nanosurf AG ● Gräubernstrasse 12, 4410 Liestal, Switzerland ● Phone: +41 61 927 47 47 ● Fax: +41 61 927 47 00 ● Copyright © 1997–2021 Nanosurf AG ● AGB / GTC ● Data Privacy Policy

Follow us on: